Flash ADC

Results: 42



#Item
31Microsoft Word - Using the ADC Exploration Board

Microsoft Word - Using the ADC Exploration Board

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Source URL: www.arrl.org

Language: English - Date: 2011-11-11 15:40:09
32Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

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Source URL: grouper.ieee.org

Language: English - Date: 2009-03-18 16:42:16
33The Designer’s Guide Community  downloaded from www.designers-guide.org Data Converters Monte Mar

The Designer’s Guide Community downloaded from www.designers-guide.org Data Converters Monte Mar

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Source URL: designers-guide.org

Language: English - Date: 2011-06-01 14:12:32
34The Designer’s Guide Community  downloaded from www.designers-guide.org Data Converters Monte Mar

The Designer’s Guide Community downloaded from www.designers-guide.org Data Converters Monte Mar

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Source URL: www.designers-guide.org

Language: English - Date: 2011-06-01 14:12:32
35Reliability Enhan
ement of Analog-to-Digital Converters (ADCs) 

Reliability Enhan ement of Analog-to-Digital Converters (ADCs) 

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Source URL: euler.ecs.umass.edu

Language: English - Date: 2012-12-16 10:12:30
36LPC2292/LPC2294[removed]bit ARM microcontrollers; 256 kB ISP/IAP flash with CAN, 10-bit ADC and external memory interface

LPC2292/LPC2294[removed]bit ARM microcontrollers; 256 kB ISP/IAP flash with CAN, 10-bit ADC and external memory interface

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Source URL: embedded.ifmo.ru

Language: English - Date: 2009-08-10 09:36:28
371  Fault Sensitivity Analysis and Reliability Enhancement of Analog-to-Digital Converters Mandeep Singh, Member, IEEE, and Israel Koren, Fellow, IEEE

1 Fault Sensitivity Analysis and Reliability Enhancement of Analog-to-Digital Converters Mandeep Singh, Member, IEEE, and Israel Koren, Fellow, IEEE

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Source URL: euler.ecs.umass.edu

Language: English - Date: 2011-01-27 16:46:18
38MT-024: ADC Architectures V: Pipelined Subranging ADCs

MT-024: ADC Architectures V: Pipelined Subranging ADCs

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Source URL: www.analog.com

Language: English - Date: 2009-02-10 14:01:11
39National Semiconductor Linear Brief 6 May 1969

National Semiconductor Linear Brief 6 May 1969

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Source URL: www.bdtic.com

Language: English - Date: 2013-01-11 10:48:07
40

PDF Document

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Source URL: www.analog.com

Language: English - Date: 2009-04-17 12:20:47