31![Microsoft Word - Using the ADC Exploration Board Microsoft Word - Using the ADC Exploration Board](https://www.pdfsearch.io/img/c05cd5d5f0b6d63531dca77ef1749659.jpg) | Add to Reading ListSource URL: www.arrl.orgLanguage: English - Date: 2011-11-11 15:40:09
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32![Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters](https://www.pdfsearch.io/img/5a0263ddffbe8be7b287618fae45c728.jpg) | Add to Reading ListSource URL: grouper.ieee.orgLanguage: English - Date: 2009-03-18 16:42:16
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33![The Designer’s Guide Community downloaded from www.designers-guide.org Data Converters Monte Mar The Designer’s Guide Community downloaded from www.designers-guide.org Data Converters Monte Mar](https://www.pdfsearch.io/img/8cafaa366ebcb6ef5068cb71687bbfc6.jpg) | Add to Reading ListSource URL: designers-guide.orgLanguage: English - Date: 2011-06-01 14:12:32
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34![The Designer’s Guide Community downloaded from www.designers-guide.org Data Converters Monte Mar The Designer’s Guide Community downloaded from www.designers-guide.org Data Converters Monte Mar](https://www.pdfsearch.io/img/4bb04e00e36a6942fd63f80eb7535f57.jpg) | Add to Reading ListSource URL: www.designers-guide.orgLanguage: English - Date: 2011-06-01 14:12:32
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35![Reliability Enhan
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36![LPC2292/LPC2294[removed]bit ARM microcontrollers; 256 kB ISP/IAP flash with CAN, 10-bit ADC and external memory interface LPC2292/LPC2294[removed]bit ARM microcontrollers; 256 kB ISP/IAP flash with CAN, 10-bit ADC and external memory interface](https://www.pdfsearch.io/img/9df6114bd6c72d2915b4b1004ea2b13f.jpg) | Add to Reading ListSource URL: embedded.ifmo.ruLanguage: English - Date: 2009-08-10 09:36:28
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37![1 Fault Sensitivity Analysis and Reliability Enhancement of Analog-to-Digital Converters Mandeep Singh, Member, IEEE, and Israel Koren, Fellow, IEEE 1 Fault Sensitivity Analysis and Reliability Enhancement of Analog-to-Digital Converters Mandeep Singh, Member, IEEE, and Israel Koren, Fellow, IEEE](https://www.pdfsearch.io/img/8e1a18e23077b882158d362ec628f3df.jpg) | Add to Reading ListSource URL: euler.ecs.umass.eduLanguage: English - Date: 2011-01-27 16:46:18
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38![MT-024: ADC Architectures V: Pipelined Subranging ADCs MT-024: ADC Architectures V: Pipelined Subranging ADCs](https://www.pdfsearch.io/img/c95b7ff2e5041f7d9ccd11cf5d2788b6.jpg) | Add to Reading ListSource URL: www.analog.comLanguage: English - Date: 2009-02-10 14:01:11
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39![National Semiconductor Linear Brief 6 May 1969 National Semiconductor Linear Brief 6 May 1969](https://www.pdfsearch.io/img/247b2b4333cd0e7dfa399b59c7717ada.jpg) | Add to Reading ListSource URL: www.bdtic.comLanguage: English - Date: 2013-01-11 10:48:07
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40![](https://www.pdfsearch.io/img/e4dc502c4b17d41e6124abb735ece912.jpg) | Add to Reading ListSource URL: www.analog.comLanguage: English - Date: 2009-04-17 12:20:47
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